WCT-120TS is a temperature-dependent minority carrier lifetime tester, which provides temperature-dependent minority carrier recombination lifetime. Solar cells are temperature-sensitive devices, and cell performance degrades at high temperatures, while minority carrier lifetime is an important indicator of cell performance.
Product Overview
Should wct-120ts minority carrier lifetime test instrument Showing a unique Measurement and Analytical techniques. wct-120 The instruments used Depend on Hinton instrument Temperature change ( Temperature range from 25 To 200 ° C) and Quasi-steady-state photoconductivity method Silicon Wafer Carrier recombination lifetime.
wct-120ts System Capabilities
Main Applications :
Measuring the minority carrier recombination lifetime in silicon wafers over a range of temperatures.
Other features:
Temperature and injection-dependent minority carrier lifetime result .
Applies to:
• initial Material (silicon wafer) Quality Control
• During wafer (silicon wafer) processing Heavy metal pollution Detection
• evaluate Surface passivation and emitter Dopant diffusion
• Use implicit IV Measuring the leakage current introduced during the evaluation process
Shanghai Sales + Technical Support + After-sales Service Center Rayscience Optoelectronic Innovation Co., Ltd address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai Telephone: 021-34635258 021-34635259 fax: 021-34635260 E-mail: saleschina@rayscience.com
