• WCT-120TS Variable Temperature Minority Carrier Lifetime Tester
  • WCT-120TS Variable Temperature Minority Carrier Lifetime Tester

WCT-120TS Variable Temperature Minority Carrier Lifetime Tester

No.WCT-120TS
The minority carrier lifetime tester of silicon wafers was obtained by using QSSPC method and variable temperature method respectively.
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  • WCT-120TS Variable Temperature Minority Carrier Lifetime Tester
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WCT-120TS is a temperature-dependent minority carrier lifetime tester, which provides temperature-dependent minority carrier recombination lifetime. Solar cells are temperature-sensitive devices, and cell performance degrades at high temperatures, while minority carrier lifetime is an important indicator of cell performance.

Product Overview

Should wct-120ts minority carrier lifetime test instrument Showing a unique Measurement and Analytical techniques. wct-120 The instruments used Depend on Hinton instrument Temperature change ( Temperature range from 25 To 200 ° C) and Quasi-steady-state photoconductivity method Silicon Wafer Carrier recombination lifetime.

wct-120ts System Capabilities

Main Applications :

Measuring the minority carrier recombination lifetime in silicon wafers over a range of temperatures.

Other features:

Temperature and injection-dependent minority carrier lifetime result .

Applies to:

• initial Material (silicon wafer) Quality Control

• During wafer (silicon wafer) processing Heavy metal pollution Detection

• evaluate Surface passivation and emitter Dopant diffusion

• Use implicit IV Measuring the leakage current introduced during the evaluation process

Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd

address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone:
021-34635258 021-34635259
fax:
021-34635260
E-mail:
saleschina@rayscience.com

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