CDE ResMap 4-point probe (ResMap 178) 4-probe test system (resistivity, surface resistance)
No.ResMap 178
CDE ResMap – CDE CDE ResMap Four-point Probe (ResMap 178) The resistance value test system produced by the company is based on the four-point probe process to cooperate with the production quality control of various semiconductor and photovoltaic manufacturers. The equipment is both excellent and reliable and easy to operate. It is indispensable for semiconductor and photovoltaic manufacturers.
CDE ResMap – The resistance value test system produced by CDE is a four-probe process to cooperate with the production quality control of various semiconductor and photovoltaic manufacturers. The equipment is both excellent and reliable and easy to operate, which is indispensable for semiconductor and photovoltaic manufacturers.
Semiconductor industry industry standard, serving many well-known semiconductor industry users!
CDE ResMap Four-point Probe (ResMap 178) CDE provides a four-point probe resistance measuring machine with automatic computer measurement. Fast, accurate and software-controlled needle insertion, the software function can optimize the needle insertion pressure, even thin slices are not easy to break. Automatic needle cleaning (Probe Conditioning); action, double needle switching. Solar energy can support automatic loader, 300mm machine can use Front End, up to 3 measurement units can be expanded, and support Semi standard interface.
American ResMap four-point probe for photovoltaic testing The features of CDE ResMap are briefly described as follows: * High-speed, stable and patented automatic range determination and Transmission, THROUGHPUT high* digital mode and up to 4000 data collection per point, good performance Good repeatability and reproducibility* Windows operating interface and simple software operation* New process performs well (Copper process low resistivity 1.67mΩ-cm and Implant high resistivity 2KΩ/□ or above, both can achieve high precision accuracy and repeatability) * Small size, less clean room space * Simple calibration, and long calibration cycle * Can be equipped with Meet customer needs, enhance functionality and applicability* 300mm models can be equipped with 2~4 measuring heads, and Can be changed by recipe setting CDE ResMap – The resistance value test system produced by CDE is based on the four-probe process to cooperate with the production quality control of various semiconductor and photovoltaic manufacturers. The extremely reliable and easy-to-use equipment is indispensable to semiconductor and photovoltaic manufacturers.
Key Features: Wide measuring range, high precision, good stability, complete and powerful functions, easy-to-use software, low maintenance cost, good service, complete accessories... Four point probe (4PP) resistivity tester/block resistance tester/solar photovoltaic diffusion sheet resistance tester imported from the United States Equipment Name: Four-point Probe Resistance Meter (CDE ResMap) Host brand, model and accessories: CDE ResMap Specification: 1. Pin material: Tungsten Carbide. 2. Pin compression force typically 100 gm to 200 gm. 3. Sample size: 2-inch to 6-inch wafer (the surface must be a flat conductive film, semiconductor material) Equipment application: Resistance distribution measurement of conductive films, semiconductors, photovoltaics Features: 1) Consistent needle tip pressure 2) Applicable to various substrate materials 3) Friendly user interface 4) Quick measurement 5) Data can be stored
application: 1) Sheet resistance
2) Sheet resistor
3) Doping concentration
4) Metal layer thickness
5) P/N type
6) I/V test
Shanghai Sales + Technical Support + After-sales Service Center Rayscience Optoelectronic Innovation Co., Ltd address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai Telephone: 021-34635258 021-34635259 fax: 021-34635260 E-mail: saleschina@rayscience.com