American ResMap four-point probe for photovoltaic testing

American ResMap four-point probe for photovoltaic testing

The features of CDE ResMap are briefly described as follows: * High-speed, stable and patented automatic range determination and
Teleport ,THROUGHPUT high* digital mode and up to 4000 data collection per point, good performance
Good repeatability and reproducibility * Windows operating interface and software are simple to operate * New process performs well
(Copper process low resistivity 1.67mΩ-cm and Implant high resistivity 2KΩ/□ or above, both can achieve high precision
Accuracy and repeatability ) * Small size, less clean room area * Simple calibration, and long calibration cycle * Can be equipped with
Meet customer needs , enhanced functionality and applicability* 300mm models can be equipped with 2~4 measuring heads, and
Can Recipe setting change

CDE ResMap – The resistance value test system produced by CDE is based on the four-probe process to cooperate with the production quality control of various semiconductor and photovoltaic manufacturers. The extremely reliable and easy-to-use equipment is indispensable to semiconductor and photovoltaic manufacturers.

Wide measuring range, high precision, good stability, complete and powerful functions, easy-to-use software, low maintenance cost, good service, complete accessories...

Four point probe (4PP) resistivity tester/block resistance tester/solar photovoltaic diffusion sheet resistance tester imported from the United States

Equipment Name: Four-point Probe Resistance Meter (CDE ResMap)
Host brand, model and accessories: CDE ResMap
Specification:
1. Pin material: Tungsten Carbide.
2. Pin compression force typically 100 gm to 200 gm.
3. Sample size: 2-inch to 6-inch wafer (the surface must be a flat conductive film, semiconductor material)
Equipment application: Resistance distribution measurement of conductive films, semiconductors, photovoltaics

The four-probe method for measuring resistivity has a great advantage that it does not require calibration; sometimes the four-probe method is also used for calibration when measuring resistivity using other methods.
Compared with the four-probe method, the traditional two-probe method is more convenient because it only requires the operation of two probes, but it is very complicated to process the data obtained by the two-probe method. As shown in Figure 1, there are two probes contacting the two ends of the resistor, and each contact point measures both the current value and the voltage value at both ends of the resistor. We hope to determine the resistance value of the measured resistor, the total resistance value:
RT = V/I = 2RW + 2RC + RDUT;
Where RW is the wire resistance, RC is the contact resistance, and RDUT is the resistance of the resistor to be measured. Obviously, this method cannot determine the value of RDUT. The correction method is to use the four-point contact method, that is, the four-probe method. As shown in Figure 2, the current path is the same as in Figure 1, but the voltage is measured using two other contact points. Although the voltage measured by the voltmeter also includes the wire voltage and the contact voltage, the internal resistance of the voltmeter is very large and the current passing through the voltmeter is very small. Therefore, the wire voltage and the contact voltage can be ignored, and the measured voltage value is basically equal to the voltage value across the resistor.
The four-probe method uses four probes instead of two probes. Although the current path is the same, the parasitic voltage drop is eliminated, making the measurement more accurate. The four-probe method became very popular after Lord Kelvin used it and was named the four-probe method.