R9000 Silicon Cell Reflectivity Meter

R9000 Silicon Cell Reflectivity Meter
Fully automatic two-dimensional scanning reflectivity instrument for solar energy field

Velvet control by reflectivity measurement
Anti-reflection coating control by color and thickness measurement

Features:

• Offline measurement of film reflectivity, film thickness and color
  Used for R&D and production process to control the quality of coating process
  Humanized design
  Accurate and repeatable
  High cost performance
  With all intellectual property rights, customized design platform is good
  Fast detection speed and simple detection process

No need to preheat the machine when starting up; testing the same sample can save workers more than 50% of their time;

Continuously testing samples saves more than 80% of workers' time.

The R9000 series is designed with higher precision, the sample is closer to the integrating sphere, and the measured reflectivity is more accurate.

Tips: According to the internationally accepted spectral measurement standard (CIE), the reflectivity measurement of diffuse reflectivity samples requires the use of an integrating sphere. Therefore, to obtain accurate data on the velvet reflectivity of the cell, an integrating sphere is required. The integrating sphere requires the sample to be as close to the opening as possible during use. The closer the sample is to the opening of the integrating sphere, the more light the integrating sphere collects, and the more accurate the reflectivity measurement.

High cost performance and after-sales service

More practical configurations and functions for the same price.
Each instrument uses high-quality parts, and all parts are fully inspected, and all systems must pass the test before leaving the factory.
The manufacturer provides complete technical information and software along with the instrument.
Free training for 2 user technicians, and training on operation demonstration, technical consultation and data processing, etc.
Repair response time: The seller will respond promptly within 24-48 hours after receiving the buyer's repair notice.
During the free warranty period, the seller is responsible for all costs incurred due to equipment quality problems.
After the warranty period, we provide lifelong maintenance service, charging only the cost of replacement according to the factory price, and no maintenance fee.
We have established logistics centers in China, which avoids the long maintenance cycles and high tariffs that are inevitable when purchasing imported products.
Independent research and development has greater independent improvement and operation capabilities, and can respond actively and effectively to different customer requirements.

R9000-2DMA automatic mapping function

-The reflectivity of a single piece of film is not uniform. Traditional reflectivity instruments can only test a certain point. Multi-point testing relies on manual movement, and the data are not comparable.

-R9000 provides fully automatic multi-point scanning function, allowing you to understand your product more accurately

R9000-2DMA Application

Cell/module anti-reflection process, optimization and monitoring include:
Acid texturing process; Alkali texturing process; SiNx anti-reflection film process; Composite anti-reflection film process
EVA packaging technology; TiO2 anti-reflection film technology; SiO2 passivation technology; Photovoltaic (velvet) glass packaging technology

Bare Die and Coated Wafer Measurements Bare Die and Coated Wafer Measurements:
Two-dimensional scanning (Mapping)
Fast and easy to operate
Integral, non-contact

Measurement parameters:
Single point reflectivity
2D Scanning Reflectivity
Cell non-uniformity
Film thickness
Chroma (color)

Product Components:
Two-dimensional automatic reflectivity meter R9000-2DMA
Standard white reference tile
Standard Specular Reflector
Control software Morpho-R9MA
Film thickness and color analysis software
Light bulb

For testing all relevant wafer types:
Monocrystalline silicon wafer (polished, roughened, textured)
Polycrystalline silicon wafers (polished, roughened, textured)
Wafer size: 125x125 / 156x156 mm