• PVE300 Solar Cell Quantum Efficiency Tester
  • PVE300 Solar Cell Quantum Efficiency Tester
  • PVE300 Solar Cell Quantum Efficiency Tester
  • PVE300 Solar Cell Quantum Efficiency Tester

PVE300 Solar Cell Quantum Efficiency Tester

No.PVE300
External Quantum Efficiency
Solar cell (photoelectric material) spectral response test, also known as quantum efficiency QE (Quantum Efficiency) test, or photoelectric conversion efficiency IPCE (Monochromatic Incident Photon-to-Electron Conversion Efficiency) test, etc., in a broad sense, is to measure the photoelectric properties of solar cells (photoelectric materials) under different wavelengths of light conditions. The so-called photoelectric properties include: photocurrent, photoconductivity, etc.
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  • PVE300 Solar Cell Quantum Efficiency Tester
  • PVE300 Solar Cell Quantum Efficiency Tester
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Product Introduction :

PVE300 Test the spectral response of solar cells, or quantum efficiency QE Quantum Efficiency ) test, or photoelectric conversion efficiency IPCE (Monochromatic Incident Photon-to-Electron Conversion Efficiency) Testing, etc. With the optional integrated range, it is also possible Measurement Internal quantum efficiency ( IQE ), as well as sampling the reflectance and transmittance. In a broad sense, it is the measurement of the photocurrent characteristics of optoelectronic materials under different wavelengths of light.

based on Bentham The company's professional technology and 25 Years of industry experience, PVE300 It can provide analytical data quickly and accurately and is a well-known international brand that has been tested by the market and widely used.

Features:

Applies to all Types of solar cells (including thin film cells), including:

Monocrystalline silicon / Polysilicon / Amorphous Silicon / Gallium Arsenide GaAs / GaInP GaInP / Indium Phosphide InP / germanium Ge / Cadmium Telluride CdTe / Copper Indium Selenide CIS / Copper Indium Gallium Selenide CIGS / Dye sensitization DSSC / Organic solar cells / Polymer solar cells

Suitable for solar cells of various structures: single junction Single junction / Multiple knots multi junction / film thin film wait

Complete analysis system:

Spectral responsivity / External quantum efficiency / Internal quantum efficiency / Reflectivity test / Transmittance test / Surface uniformity / Short circuit current density

It can be achieved Full spectrum sunlight simulation ( 300~2500nm ), the photovoltaic materials tested extend to near-infrared

Direct measurement SR and QE

Cross flow meter, bias source and built-in detector ensure test accuracy

Optical density measurement room

2 0x20cm Temperature controlled vacuum device with accuracy less than 1 Spend

Choice of single or multi-channel solar simulator

Calibrated Reference Silicon / Germanium detector

The entire product software has super compatibility

Integrated design makes operation more convenient and the system more stable

The system can be upgraded to adopt dual monochromatic reference solar device to meet the highest accuracy measurement requirements.

Provide complete 3 Year standard warranty.
Optional features:

Optional Internal quantum efficiency ( IQE ) Device

automation XY Platform, precise measurement of uniformity

Second set of monochromators (capable of measuring the uniformity and characteristics of fluorescent materials)

Design and configuration according to customer needs

Technical parameters:

Top of form

Monochrome probe Bottom of the form

Probe light source

Quartz halogen and/or xenon

Monochrome configuration

Symmetrical, Czerny-Turner type grating monochromator

Monochrome focal length

300 Millimeters

bandwidth

Adjustable fixed slit, 1-10nm (typical)

Raster number

1-3

Resolution

0.3nm (1200g/mm); 0.6nm (600g/mm)

Dispersion

2.7nm/mm (1200g/mm); 5.4nm/mm (600g/mm)

Wavelength accuracy

±0.2nm (1200g/mm); ±0.4nm (600g/mm)

Probe Imaging System

Image-based

Probe size

1- 10mm

Temperature control device

Temperature control

Peltier-based heat pump

Temperature stability

±1℃

Solar Simulator

Transmission method

Branched fiber bundles

Bias source irradiation

0-1.5 sun

Bias source uniformity

±1%

Testing electronics

Reference Calibrator

Silicon 300-1100nm; Germanium 800-1800nm

Maximum photocurrent

transformer ? 1A ;477 amplifier ? 100mA

Minimum response (transformer)

0.03 AW -1 nm -1 5nm BW, 2 Millimeter probe

software

Software Control

BenWin+ Windows app

Measurement capabilities

Spectral response, S λ )( AW -1

Absolute spectral response of the device

External quantum efficiency EQE λ ) (%)

EQE (λ)(%)=1.24x105xS(λ)/λ(nm), also known as IPCE.

The reflectivity of the sample, R λ ) (%)

Total reflectivity (diffuse and specular)

The transmittance of the sample T λ ) (%)

Diffuse transmission

Internal quantum efficiency, IQE λ ) (%) Bottom of the form

Correction to take into account the photons reaching the active region

Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd

address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone:
021-34635258 021-34635259
fax:
021-34635260
E-mail:
saleschina@rayscience.com

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