Photovoltaic inspection microscope: With the continuous development and improvement of polysilicon, silicon wafers, and solar cell technology, the photovoltaic industry has increasingly higher requirements for the inspection of silicon wafer and cell quality. This instrument is specially used for microscopic quality inspection of silicon wafers and solar cells. The inspection results are fast, intuitive and accurate. ■ Detection of silicon wafer defects such as dislocation, stacking fault, scratches, and edge collapse; ■ Analyze the impurities and residue components of silicon wafers; ■ Inspection of the texturing quality of solar cells, precise measurement of grid line dimensions, inspection of defects such as cracks and contamination.
With the continuous development and improvement of polysilicon, silicon wafers, and solar cell technology, the photovoltaic industry has increasingly higher requirements for the quality testing of silicon wafers and solar cells. This instrument is specially used for microscopic quality inspection of silicon wafers and solar cells. The inspection results are fast, intuitive and accurate. ■ Detection of silicon wafer defects such as dislocation, stacking fault, scratches, and edge collapse; ■ Analyze the impurities and residue components of silicon wafers; ■ Inspection of the texturing quality of solar cells, precise measurement of grid line dimensions, inspection of defects such as cracks and contamination.
Features
■ Direct observation: a simple corrosion treatment of the silicon wafer can be performed to observe the microscopic image and find defects. ■ Suitable for defect observation of silicon wafers, and can observe dislocations, stacking faults, scratches, edge collapse, etc. that are invisible to the naked eye. ■ Analyze images in real time with computer software. ■ Make silicon wafer defect observation simpler and more accurate, while greatly reducing work intensity. ■ Use 3-5 million photosensitive chips, which are small in size, clear in imaging, delicate in lines and rich in colors. ■ USB2.0 transmission setting, fast transmission speed.
Technical specifications
■ Observation mode: bright field/dark field observation, polarized light observation, differential interference observation (optional); ■ Observation head: hinged trinocular head, 30° tilt; ■ Large field of view high eye flat field eyepiece: WF10X field of view range 25mm; ■ Long working distance infinity plan-field bright-field and dark-field metallographic objectives (4 as standard); 5×/0.1BD/WD29.4mm、10×/0.25BD/WD16mm、 20×/0.40BD/WD10.6mm、40×/0.60BD/WD5.4mm、 50×/0.55BD/WD5.1mm, 100×/0.80BD/WD3mm (dry lens) ■ Converter: Internally positioned four-hole converter with differential interference jack; ■ Coaxial focusing for coarse and fine motion, using gear rack transmission mechanism, fine motion value 0.002mm ■ Stage: Low-position coaxial manual grass group, platform size: 190mm×162mm (customizable), moving range 82mm×51mm (customizable) ■ Polarizing device: The analyzer can rotate 360 degrees, and the polarizer and analyzer can be moved out of the light path; ■ Transmitted/epiped illumination: halogen lamp 12V/50W, AC85V-230V, brightness adjustable.
Shanghai Sales + Technical Support + After-sales Service Center Rayscience Optoelectronic Innovation Co., Ltd address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai Telephone: 021-34635258 021-34635259 fax: 021-34635260 E-mail: saleschina@rayscience.com
