Btimaging PL/EL Tester LIS-R2-Plus

R3&R2-Plus PL imaging detection system (photoluminescence imaging detection system) from BT Imaging, Australia
LIS-R3

LIS-R3 is a newly upgraded TOP laboratory equipment for silicon blocks, silicon rods, silicon wafers, solar cells and small modules. After years of development and continuous improvement, many TOP research institutions and silicon wafer, battery and module manufacturers are using this equipment. The main applications include process improvement, laboratory research and development, process debugging and root cause problem analysis, quality assurance and quality control, and speeding up the installation process and equipment final acceptance process. LIS-R3 applies BT imaging's photoluminescence technology and Rs imaging, electroluminescence imaging, bias PL imaging, QSS-PC injection level-determined minority carrier lifetime curves, calibrated minority carrier lifetime imaging, deep image processing algorithms to automatically derive silicon wafer and silicon ingot defect parameters, Suns-Voc curves, dark field and light field IV testing, plus a series of new analysis methods in the LIS-R series software update package.

LIS-R2-Plus

All-round R&D equipment for photovoltaic laboratories and quality control

The LIS-R2-Plus benefits from extensive development work by BT Imaging, which reduced the cost of the original LIS-R2 lab equipment. Now we are passing the benefit on to our customers by reducing the price of the new LIS-R2 equipment. The new LIS-R2-Plus is the leading comprehensive PL lab measurement equipment for silicon blocks, wafers and cells. It is also suitable for sampling inspections in battery production lines, helping to achieve fast feedback and debugging on each process line. Backed by a large number of BT Imaging patents.

iLS-W3

Production line silicon wafer inspection

iLS-W3 is the ultimate silicon wafer electrical quality inspection module with newly designed software and hardware. It is an inspection system for silicon wafer and battery production lines. The device incorporates BT Imaging's patented PL imaging technology and has a wafer inspection speed of up to 5400 wafers per hour. It is an online PL inspection machine with numerous photoluminescence patents and market-leading algorithms. Typical use cases include silicon wafer rejection, silicon wafer quality sorting through battery efficiency prediction, silicon wafer and battery R&D, and production line process improvement and debugging.

iLS-C3

Production line battery defect detection

iLS-C3 is the latest continuous PL imaging inspection module for production line batteries. It is a faster and non-contact inspection method than EL imaging. Using automatic imaging algorithms, iLS-C3 can find all defects in a battery during production and choose to reject it. This module can be configured for process wafer PL inspection.

LIS-B3

Production line silicon block and crystal rod inspection

LIS-B3 is BT Imaging's latest silicon block and ingot inspection equipment, which ensures that the silicon wafers produced later can be used as materials for high-efficiency batteries by reporting the bulk life of such samples. The equipment is a helper for quality control and process improvement. The design of LIS-B3 is the result of careful consultation with leading silicon block and ingot manufacturers. Silicon blocks and ingots are loaded manually or mechanically. The measurement rate can meet 100% product inspection.

It can be easily adapted to most battery designs and sorting equipment