IQE-SCAN Spectral Quantum Efficiency

Quantum Efficiency Tester

This tool is designed for automated IQE analysis of IQE

Crystalline silicon solar cells. Some features are:

• The solar cell is illuminated with variable light, evenly covering an area of ​​20 x 20 mm.

Or the focal point is approx. 1 x 3mm².

• Comprehensive EQE and reflectance measurements are performed by continuously moving a 4 cm2 illuminated area.
• Monochromatic light between 280-1600 nm from a monochromator (2 gratings, slit width and ordered filters change automatically). Typically used bandwidth is 8 nm FWHM with a wavelength accuracy of 1 nm.
• White light bias of up to 1.2 suns is limited to monochromatic lighting areas.
• Quasi-bias automatically determines the correct bias light intensity for quasi-absolute EQE measurements

Only one wavelength scan is required. The procedure can also be used to check the linearity of solar cells.

• Reflectivity is measured at an 8° tilted beam of 2 x 2cm² with a BaSO4-coated integrating sphere.
• Batch mode where a series of measurements are performed under different conditions.
• The solar cells are held on a temperature-controlled vacuum chuck (25°C) and can be moved electrically

xyz stage. The temperature is measured directly on the back side of the solar cell.

• Automatic calibration of EQE and reflectivity
• -Increases throughput and reduces the time required for operator interaction.
• - Makes operation safer and avoids human errors (misalignment, bias light, etc.).
• - Degradation of the reference solar cell is avoided by manual operation.
• Motorized contact setup and switching between EQE and reflectivity measurements.
• Data analysis by comparison with analytical electrical and optical models.
• Duration:

- About. 1 sec. Each wavelength is used for point measurement (2 x 2cm²)

- About. 9 seconds. Wavelength per 12.5×12.5 square centimeters solar cell

- About. 12 seconds per wavelength 15.6 x 15.6cm² solar cell

• EQE and reflectivity mapping of focused light spots (QMAP)