HSL2 Minority Carrier Lifetime Analyzer

No. HSL2

HSL2 Minority Carrier Lifetime Analyzer

Features
● Conforms to American ASTM standards
● Can measure silicon wafers and silicon blocks, can increase minority carrier lifetime map
● Non-destructive and non-contact measurement
Main parameters
Test range and accuracy
Testable Materials	Monolithic or bulk silicon materials
	Solar cell after diffusion to form PN (without metal electrode)
Minority carrier lifetime test range	1 μs~1000μs
Resistivity test range	≥0.1Ωcm
Resolution	5mm
Test non-repeatability	≤2%
Test speed	5 Seconds/points
Mechanical parameters
Microwave source	Lengthwidthheight: 1400mm1380mm810mm
Industrial Computer
Pulsed laser source
Requirements
powered by	AC single phase, 220V/110V±10%, 20A, 50/60Hz

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HSL2 Minority Carrier Lifetime Analyzer

Features
● Conforms to American ASTM standards
● Can measure silicon wafers and silicon blocks, can increase minority carrier lifetime map
● Non-destructive and non-contact measurement
Main parameters
Test range and accuracy
Testable Materials	Monolithic or bulk silicon materials
	Solar cell after diffusion to form PN (without metal electrode)
Minority carrier lifetime test range	1 μs~1000μs
Resistivity test range	≥0.1Ωcm
Resolution	5mm
Test non-repeatability	≤2%
Test speed	5 Seconds/points
Mechanical parameters
Microwave source	Lengthwidthheight: 1400mm1380mm810mm
Industrial Computer
Pulsed laser source
Requirements
powered by	AC single phase, 220V/110V±10%, 20A, 50/60Hz

Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd
address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone: 021-34635258 021-34635259
fax: 021-34635260
E-mail: saleschina@rayscience.com

HSL2 Minority Carrier Lifetime Analyzer

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Contact Us

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