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Features |
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● The test principle adopts the internationally recognized microwave reflection photoconductivity decay method |
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● Use professional lasers with sufficient pulse energy and suitable wavelength as the excitation source, with reliable and stable performance |
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● Convenient and intuitive operation process with simple steps |
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Main parameters |
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Test range and accuracy |
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Testable Materials |
Silicon wafer or bulk silicon material |
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Solar cell after diffusion to form PN (without metal electrode) |
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Minority carrier lifetime test range |
(1~1000)μs |
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Resistivity test range |
≥0.1Ω·cm |
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Test non-repeatability |
≤5%( When the test conditions remain unchanged) |
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Test speed |
2 Seconds/points |
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Mechanical parameters |
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Microwave source |
10Kg; 465mm( Length)*230mm(width)*470mm(height) |
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Industrial Computer |
20Kg; 500mm( Length)*400mm(width)*170mm(height) |
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Pulsed laser source |
10Kg; 350mm( Length)*130mm(width)*450mm(height) |
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Requirements |
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powered by |
220VAC±10%, 20A, 50/60Hz , single-phase electricity |
