Hall Effect Tester

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The Hall effect tester is used to measure important parameters of semiconductor materials such as carrier concentration, mobility, resistivity, and Hall coefficient. These parameters must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, it is an essential tool for understanding and studying the electrical properties of semiconductor devices and semiconductor materials.

Hall8800 Hall Effect Tester Introduction

This instrument is a Hall effect instrument with stable performance, powerful functions and high cost performance. It has a wide range of users and popularity in domestic universities, research institutes and the semiconductor industry.

It is mainly used to measure important characteristic parameters of electronic materials, such as carrier concentration, mobility, resistivity, Hall coefficient, etc., both thin film and bulk materials can be used. Its principle is mainly based on the Vanderbilt law.

The instrument is light, convenient and easy to carry. It is mainly used to measure important characteristic parameters of electronic materials, such as carrier concentration, mobility, resistivity, Hall coefficient, etc., both thin film and bulk materials can be used. Its principle is mainly based on the Vanderbilt law.

In addition to determining the type (n or p) of semiconductor materials, it can also be used to determine the quality of LED epitaxial layers and to determine whether two-dimensional electron gas is formed in HEMT components. It can also be used to assist in the process of solar cell manufacturing.

Hall8800 can be said to be a powerful and widely applicable system. Coupled with its affordable price, I believe it will be recognized and loved by users from all walks of life.

Currently widely used in semiconductor manufacturers.

Main Features

1. High-precision current source

The accuracy of the output current can reach 2nA. Such a small current can be used to measure semi-insulating materials, that is, high resistance materials.

2. High-precision electric meter

Using ultra-high precision meters, the voltage measurement capability can reach nV level, and the upper limit can reach 300V, which is very suitable for measuring low resistance materials.

3. Simple appearance and easy operation

The appearance is light and beautiful. The polarity of the magnet group can be changed flexibly and easily. The unique liquid nitrogen container design can ensure the best stability of low-temperature measurement.

4. IV curve

The current-voltage curve between the four points (A, B, C, D) of the probe is measured in a graphical manner to judge the quality of the sample's ohmic contact.

5. Simple and easy-to-use operation interface

The user can complete all settings on the same operation screen. The experimental results are automatically calculated by the software and displayed on the same screen, eliminating the trouble of screen switching. The results can simultaneously obtain important experimental data such as bulk carrier concentration, surface carrier concentration, mobility, resistivity, Hall coefficient, etc.

6. Self-developed spring sample fixture and specially designed spring probe, whose enhanced strength can improve the electrical contact between the probe and the contact point, and enhance the reliability of measurement.

Technical Parameters

Magnetic field strength: 0.65T/1T;

Measured at room temperature and liquid nitrogen temperature (77K);

Output current: 2nA-100mA;

Mobility (cm2/Volt-sec): 1-107

Impedance:10-6 to 107

Carrier concentration (cm-3): 107 - 1021

Sample fixture:

Hall8800 spring sample fixture (avoids the trouble of making Hall samples);

Measuring materials: All semiconductor materials including Si, ZnO, SiGe, SiC, GaAs, InGaAs, InP, GaN (both N-type and P-type can be measured)

Instrument size (WxDxH): 260*220*180 mm

Instrument weight: 6kg

Buy Hall8800 now and you can enjoy free upgrade of the configuration of the test liquid nitrogen temperature area and get 99.999% pure indium wire for electrode use.
1 Application scope: Research on the electrical properties of semiconductor devices and semiconductor materials, and precision measurement of important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials

2 Specification:

2-1 Maximum sample size (Small board) - 15mm x15mm

Maximum sample size: 15mm x15mm (customizable)

2-3 Measurement Material: Semiconductors material such as

Si, SiGe, SiC,GaAs, InGaAs, InP, GaN, ITO (N Type & P Type)

Test material: semiconductor materials, such as:

All semiconductor films (P-type and N-type) such as Si, SiGe, SiC, ZnO, GaAs, InGaAs, InP, GaN, ITO, etc.

2-1 Resistivity (Ohm.cm): 10-5 to 107

Resistivity(Ω.㎝): 10-5 to 107

2-2 Mobility (cm2/Volt.sec): 1 ~ 107

Mobility (cm2/Volt.sec): 1 ~ 107

2-3 Carrier Density (cm-3): 107 ~ 1021

Carrier concentration (1/cm3): 107 ~ 1021

Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd
address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone: 021-34635258 021-34635259
fax: 021-34635260
E-mail: saleschina@rayscience.com

Hall Effect Tester

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