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Home > All Collections > Fast Quantum Efficiency Measure

Fast Quantum Efficiency Measure

No.G645C8F48D7D5E

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Simply made to rocket up your solar cell manufacturing R&D.

Now, you can do what before was impossible.

Measure the EQE curve

as fast as the IV.

Place your EQE system

whatever you want,

on your lab bench, in-line,

or even inside a glove box,

and explore new possibilities.

Run, test, change

myriad of parameters,

make thousands of samples,

and finally measure the EQE

instantaneously.

Or, why not to rely on

machine learning

to quickly explore

your key landscape parameters?

With the Fast EQE, all this, and even more, is now pos

Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd
address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone: 021-34635258 021-34635259
fax: 021-34635260
E-mail: saleschina@rayscience.com

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product: Materials 3D Real-time Dynamic Microscope MEMS Semiconductor; Zeta-300 Optical Profiler Surface Profile Testing System; LOANA; Minority Carrier Lifetime Tester WCT-120MX; FastEQE High-speed Quantum Efficiency Tester; Minority Carrier Lifetime Tester BCT-400 Testing Silicon Ingot; WCT-120 / 120MX Silicon Wafer Life Tester; Electrochemical ECV doping concentration detection Electrochemical CV distribution instrument (CV tester) Electrochemical CV profile analyzer Electrochemical CV carrier concentration junction depth tester; Contact resistivity and sheet resistance TLM-SCAN+ Multifunctional solar cell grid line contact resistance tester

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