• TLM-SCAN+  Contact resistivity and sheet resistance
  • TLM-SCAN+  Contact resistivity and sheet resistance

TLM-SCAN+ Contact resistivity and sheet resistance

No.TLM-SCAN+
TLM-SCAN+ Contact resistivity and sheet resistance
The contact resistance of the front metallization is an important contribution to the total series resistance of screen-printed solar cells. The transfer length method with a suitable test structure is
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  • TLM-SCAN+  Contact resistivity and sheet resistance
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Contact resistivity and sheet resistance

The contact resistance of the front metallization is an important contribution to the total series resistance of screen-printed solar cells. The transfer length method with a suitable test structure is the best method to separate the contact resistance from other series resistance effects. However, the contact resistance may vary considerably over the solar cell so a method to measure it with spatial resolution on the finished solar cell is necessary. The TLM-SCAN creates mappings of the contact resistivity of a solar cell that is cut into stripes with a laser or a dicing saw.

The mapping on the right demonstrates the resolution and repeatabilty as it shows the same stripe measured 14 times.

Compatible with the size of the battery after cutting

Sample strip cutting width range

230mm (backward compatible)

5mm-10mm

Probe model (modified according to customer needs)/fine grid line spacing

Function

A total of 5 probes:
0.7/0.75/0.8/0.85/0.9mm probe, 1 each;

Motorized positioning in x, y and z
Vacuum-mounted sample stage (pump not included)

Can test the contact resistance of the prepared battery strip, Rsheet,

The contact resistance of single or multiple prepared samples can be tested continuously

Repeatability (test original reference block - included in the goods)

TBC, BC batteries

Automatically create mapping and line resistance functions

5%

Currently, we do not have the ability to test TBC and BC batteries. Customers are required to provide samples and the original factory will test the samples to determine whether they match.

Function to identify fine gate pitch

Computer configuration

Available (including the second robotic arm)

Subject to the random computer configuration from Germany, cannot be customized

Device size

weight

45 cm x 55 cm x 28 cm (TLM-SCAN+)

28kg (excluding the weight of computer and monitor)

Universal supply voltage

Relative humidity

220V (±6%) 50Hz

< 80%, no condensation

Warranty

One-year warranty

Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd

address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone:
021-34635258 021-34635259
fax:
021-34635260
E-mail:
saleschina@rayscience.com

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