LBIC Spectrally resolved beam-induced current mapping LBIC maps different wavelengths
The instrument simultaneously measures short-circuit current and reflectivity maps at 6 discrete wavelengths between 405nm and 1064nm at a rate of 10ms per pixel. PIXIE calculates these maps as maps of effective diffusion length, fundamental saturation current, dead layer thickness, and current collection probability for surface-generated carriers.
The spot size is approximately 100 microns. Use a monitor detector to offset intensity variations of the light source. We offer costum chucks to make it easy for you to access your solar cell type.
Spectrally resolved light beam induced current mapping
This table instrument measures mappings of the short circuit current and the reflectance at 6 discrete wavelengths between 405 nm and 1064 nm simultaneously at a speed of 10 ms per pixel. PIXIE calculates these maps into maps of effective diffusion length, base saturation current, dead layer thickness, and current collection probability for surface-generated carriers.
The spot size is approximately 100 µm. Intensity variations of the light sources are canceled out using a monitor detector. We provide costum chucks to make contacting your type of solar cell easy.
Shanghai Sales + Technical Support + After-sales Service Center Rayscience Optoelectronic Innovation Co., Ltd address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai Telephone: 021-34635258 021-34635259 fax: 021-34635260 E-mail: saleschina@rayscience.com