VLSI Standard Samples VLSI Standard Samples is committed to providing measurement standard samples and related services to the global semiconductor and related industries. The standard samples currently provided by VLSI can be used to calibrate various high-precision measurement instruments and can be traced back to NIST
VLSI Standards is committed to providing measurement standards and related services to the global semiconductor and related industries. The standard samples currently provided by VLSI can be used to calibrate a variety of high-precision measurement instruments and can be traced back to NIST.
Features: ◆Support ISO or TS quality system certification; ◆Traceable to NIST; ◆Higher reliability; ◆ Smaller uncertainty.
application: ◆Particle standard sample: used to calibrate particle detector; ◆Film thickness standard sample: used to calibrate film thickness meter; ◆Step height standard sample: used to calibrate the surface profiler; ◆Line width standard sample: used to calibrate scanning electron microscope or atomic force microscope; ◆Resistance standard samples: used to calibrate resistance measuring instruments; ◆Solar reference cells: used to calibrate photoelectric conversion efficiency measuring instruments.
Shanghai Sales + Technical Support + After-sales Service Center Rayscience Optoelectronic Innovation Co., Ltd address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai Telephone: 021-34635258 021-34635259 fax: 021-34635260 E-mail: saleschina@rayscience.com
