Features:
Ø The freely configurable fiber optic architecture can be installed on production lines, in semiconductor wafer grinding equipment or vacuum coating equipment.
Ø Remote synchronous control, high-speed multi-point synchronous measurement, etc.
Ø A wide range of optical system packages and application software provide the most ideal film thickness solutions for special environments.
Product architecture:
Ø Semiconductor wafer surface distribution Measurement
Ø Distribution within the glass substrate Measurement
Ø Real-time measurement
Ø Fixed-point quality control in the conveying direction
Ø Equipment for vacuum environment
Ø Immediacy Measurement
Ø Total quality management in the conveying direction
