Measurement range from thin film to thick film, UV～NIR spectral analysis. High performance and low price optical thin film measuring instrument. The film thickness was analyzed by absolute reflectance spectroscopy. It fully inherits 90% of the powerful functions of the high-end FE-3000 model. No complicated settings, simple operation, you can get started in a short time. Nonlinear least squares method to analyze optical constants (n: refractive index, k: extinction coefficient)
