Offline data analysis:
Simulation and sensitivity analysis, multi-sample measurement, production batch processing.
| Accuracy | 0.01nm or 0.01% |
| Accuracy | 0.2% or 1 nm |
| stability | 0.02nm or 0.03% |
| Spot size | The standard is 3mm, and can be as small as 3μm |
| Sample size | From 1mm |
| Model | wavelength | Range Spectrometer Detectors/Detectors/Light Sources | Thickness range* |
| VIS | 400-1100 nm | Spectrometer F4/Si 3600 pixels/ Tungsten-halogen light source |
15 nm to 20 mm (option:up to 50 mm) |
| UVVisSR | 200-1100 nm | Spectrometer F4/ Si CCD 3600 Pixel/deuterium-tungsten halogen combined light source |
3 nm to 20 mm (option:up to 50 mm) |
| HRVIS | 700-1000 nm | HR spectrometer F4/Si 3600 pixels/ Tungsten-halogen light source |
1 mm to 400 mm |
| NIR | 900-1700nm | Transmission Spectrometer (TVG) F2/512 InGaAs/Tungsten-Halogen Light Source |
100 nm-200 mm |
| VISNIR | 400-1700 nm | Spectrometer F4 Si CCD 3600 pixels (Vischannel); Transmission spectrometer (TVG) F2/512 InGaAs PDA (NIR channel) tungsten-halogen light source |
15 nm to 200 mm |
| UVVISNIR | 200 -1700 nm | Spectrometer F4 Si CCD 3600 Pixel (Vis channel); transmission Deuterium-tungsten halogen combined light source |
3 nm -200 mm |
| NIRScan | 900nm -5000nm | Scanning spectrometer/InGaAs/ MCT detector (scan time < 60 seconds) TH-SiN light source |
100 nm -800 mm |
| XT | XT 1590nm -1650nm | Transmission Spectrometer (TVG) F2/512 InGaAs/Tungsten-Halogen Light Source |
10 mm - 1 mm |
