3S Probe Station Manual Probe Station Automatic Probe Station
No.G4EC3292F8C51C
3S probe station: 3S provides probe stations for various purposes, including: wafer probe station, flat panel (LCD/OLED) probe station, RF probe station, LD/PD probe station, high and low temperature probe station, surface resistivity probe station (four-probe station), Hall effect probe station, and customized probe station; Probe station components, including: long working distance microscope, anti-vibration table, shielding box, probe holder and various probes, high temperature chuck, probe card, RF probe, adapter, cable; Upgrade of existing probe stations
3S provides probe stations for various purposes, including: wafer probe stations, flat panel (LCD/OLED) probe stations, RF probe stations, LD/PD probe stations, high and low temperature probe stations, surface resistivity probe stations (four-probe stations), Hall effect probe stations, and customized probe stations; Probe station components are provided, including: long working distance microscopes, anti-vibration tables, shielding boxes, probe holders and various probes, high temperature chucks, probe cards, RF probes, adapters, and cables; Upgrades of existing probe stations; EVER-BEING INT'L CORPORATION has been focusing on the research and development and production of probe stations for 16 years, with the largest market share in Taiwan, and provides probe station solutions that are comparable to European and American product quality, more practical, and more cost-effective. We now warmly recommend it to research and production units engaged in semiconductor materials, devices, etc., and can undertake probe equipment of various special specifications and requirements.
Key Features:
application: 1) Sheet resistance 2) Sheet resistor 3) Doping concentration 4) Metal layer thickness 5) P/N type 6) I/V test
Technical parameters:
1) Chuck size: standard 4 inches, optional 6 inches and 8 inches 2) Test head up and down displacement: 10mm 3) Z-direction resolution: 1 micron 4) Probe material: tungsten steel 5) Probe spacing: 40mil, 50mil, 62.5mil 6) Probe pressure: 45g, 85g, 180g 7) Tip radius: 40.6 microns
Shanghai Sales + Technical Support + After-sales Service Center Rayscience Optoelectronic Innovation Co., Ltd address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai Telephone: 021-34635258 021-34635259 fax: 021-34635260 E-mail: saleschina@rayscience.com
