Infrared silicon ingot defect detector: During the polysilicon ingot casting process, various defects may occur due to raw materials, impurities, crucibles, temperature field control, etc., such as SIC particles, hidden cracks, voids, microcrystals, etc. The existence of these defects cannot produce qualified polysilicon solar cells, and is extremely harmful to the subsequent slicing process. Because the hardness of SIC is extremely high, it will cause the wire to break. The existence of silicon cracks will cause the silicon wafer to fall and even damage the guide wheel.
How to detect these defects without damaging the silicon block? Theoretically, there are many methods, such as X-ray, ultrasonic detection, infrared projection, etc., which are commonly used methods. However, considering the cost, working environment, labor protection, work efficiency and ease of operation, infrared projection is the most suitable method.
Infrared silicon ingot defect detector: During the polysilicon ingot casting process, various defects may occur due to raw materials, impurities, crucibles, temperature field control, etc., such as SIC particles, hidden cracks, voids, microcrystals, etc. The existence of these defects cannot produce qualified polysilicon solar cells, and is extremely harmful to the subsequent slicing process. Because the hardness of SIC is extremely high, it will cause the wire to break. The existence of silicon cracks will cause the silicon wafer to fall and even damage the guide wheel.
How to detect these defects without damaging the silicon block? Theoretically, there are many methods, such as X-ray, ultrasonic detection, infrared projection, etc., which are commonly used methods. However, considering the cost, working environment, labor protection, work efficiency and ease of operation, infrared projection is the most suitable method.
answer use: Polysilicon block inspection
Detection size: Maximum 210mmX210mmX300mm
Image resolution: 768×576
electricity source: 230V 50/60HZ Equipment appearance: 1689mm long × 837mm wide × 1422mm high
[Powerful software functions]: What you see is what you get real-time image acquisition
High-definition image display
Environmental background denoising
Real-time image contrast enhancement and reduction
Auxiliary memory entry function
Real-time annotation, Chinese annotation
Shortcut key function
Fast database query
Catalog database maintenance
Text report function
Print report function
Full Chinese interface
[Positionable turntable]: The platform on which the silicon block is placed can be manually rotated and positioned in 90-degree steps, which can speed up the detection speed.
【Scientific-grade camera】: More than 1200 lines. Powerful functions, stable performance, brightness, resolution and other parameters related to image quality can be adjusted. The camera can be flexibly adjusted, front and back, up and down, left and right, focus.
【Image resolution】: 768×576
[Maximum inspection size]: 210mm×210mm×300mm
[Super strong infrared efficiency]: The camera's infrared receiving sensitivity is up to 80%
[Sufficient operating space]: The platform has enough operating space to quickly move the silicon block and to make it convenient to directly draw lines on the silicon block.
