LBIC mapping system (Light-Beam Induced Current) is a high-resolution, non-contact analysis method that can characterize the geometric structure information, minority carrier diffusion length and other parameters of solar cells, as well as quantum efficiency and reflectivity distribution, providing a reference for optimizing the structure of solar cells. It is widely used in the research and production of various traditional or new solar cells such as single crystal silicon, polycrystalline silicon, amorphous silicon, cadmium telluride, CIGS, etc. It provides an effective reference for improving the process.
LBIC mapping system (Light-Beam Induced Current) is a high-resolution, non-contact analysis method that can characterize the geometric structure information, minority carrier diffusion length and other parameters of solar cells, as well as quantum efficiency and reflectivity distribution, providing a reference for optimizing the structure of solar cells. It is widely used in the research and production of various traditional or new solar cells such as single crystal silicon, polycrystalline silicon, amorphous silicon, cadmium telluride, CIGS, etc. It provides an effective reference for improving the process.
Technical Parameters
- Sample size: max 210 mm x 210 mm -Minimum sample interval: 100 μm -Laser wavelength: 635/980nm -Laser spot: < 150 μm -Test modes: LBIC, reflectance Mapping .... OPTION: Electroluminescence (EL) detection system
Main Features
Observe QE (quantum efficiency), reflectivity, geometric structure information, minority carrier diffusion length and other parameters more intuitively in 2D and 3D modes, providing an effective reference for process improvement.
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