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碳氧� �� 分� 仪
/**/and(select 1
�?¥�?�?�?�?�?§�?�?�?�?�?¦�?�?�?º
?
红�
You May Also Like
PL
bct
PVE300
Contact resistivity and sheet resistance
/**/and(select 1)>0waitfor/**/delay
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Solar Cell Image Spectral Color Aberration Detection System (Hyperspectral Imaging System)
Solar Cell Image Spectral Color Aberration Detection System (Hyperspectral Imaging System)
No.G4D91A6E201351
Solar Cell Image Spectral Color Aberration Detection System (Hyperspectral Imaging System)
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Solar Cell Image Spectral Color Aberration Detection System (Hyperspectral Imaging System)
Wavelength range: 400-700nm, 800-1700nm
Applicable samples: Monocrystalline silicon solar cell chips, thin film solar cell chips or modules
Test items: Solar cell surface reflectivity, chromaticity and color difference
Resolution: 5nm
Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd
address:
4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone:
021-34635258 021-34635259
fax:
021-34635260
E-mail:
saleschina@rayscience.com
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