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WEP-CVP21
红外
PVE300
'and(select*from(select sleep(6))a/**/union/**/select 1)=
/**/and(select*from(select sleep(6)union/**/select 1)a
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/**/and(select 1)>0waitfor/**/delay
Contact resistivity and sheet resistance
PL
bct
FPP
021-34635258
front page
about Us
Success Stories
about Us
Product Introduction
Product Categories
News
Exhibition activities
News
blog
Download Center
Contact Us
Search History
WEP-CVP21
红外
PVE300
'and(select*from(select sleep(6))a/**/union/**/select 1)=
/**/and(select*from(select sleep(6)union/**/select 1)a
You May Also Like
/**/and(select 1)>0waitfor/**/delay
Contact resistivity and sheet resistance
PL
bct
FPP
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简体中文
English
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Solar Cell Image Spectral Color Aberration Detection System (Hyperspectral Imaging System)
Solar Cell Image Spectral Color Aberration Detection System (Hyperspectral Imaging System)
No.G4D91A6E201351
Solar Cell Image Spectral Color Aberration Detection System (Hyperspectral Imaging System)
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Solar Cell Image Spectral Color Aberration Detection System (Hyperspectral Imaging System)
Wavelength range: 400-700nm, 800-1700nm
Applicable samples: Monocrystalline silicon solar cell chips, thin film solar cell chips or modules
Test items: Solar cell surface reflectivity, chromaticity and color difference
Resolution: 5nm
Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd
address:
4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone:
021-34635258 021-34635259
fax:
021-34635260
E-mail:
saleschina@rayscience.com
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