Electroluminescence imaging analysis (EL)

No.G4D91A61F19A84

Electroluminescence imaging (EL): large and microcracks, holes, inclusions, diffusion length, and poor contact or conduction areas

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Electroluminescence imaging analysis (EL)

Detection capabilities: large and microcracks, holes, inclusions, diffusion length, and poor contact or conduction areas
Sample size: 5-inch and 6-inch solar cell chips or modules
Detection speed: within 0.5 seconds
Resolution: up to 600um
Power supply: Select according to sample specifications, 8V-20A, 6.7V-30A and 20V-50A are available

Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd
address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone: 021-34635258 021-34635259
fax: 021-34635260
E-mail: saleschina@rayscience.com

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Electroluminescence imaging analysis (EL)

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