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WEP-CVP21
红外
PVE300
'and(select*from(select sleep(6))a/**/union/**/select 1)=
/**/and(select*from(select sleep(6)union/**/select 1)a
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/**/and(select 1)>0waitfor/**/delay
Contact resistivity and sheet resistance
PL
bct
FPP
021-34635258
front page
about Us
Success Stories
about Us
Product Introduction
Product Categories
News
Exhibition activities
News
blog
Download Center
Contact Us
Search History
WEP-CVP21
红外
PVE300
'and(select*from(select sleep(6))a/**/union/**/select 1)=
/**/and(select*from(select sleep(6)union/**/select 1)a
You May Also Like
/**/and(select 1)>0waitfor/**/delay
Contact resistivity and sheet resistance
PL
bct
FPP
EN
简体中文
English
Language
简体中文
English
获取报价或资料
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Electroluminescence imaging analysis (EL)
Electroluminescence imaging analysis (EL)
No.G4D91A61F19A84
Electroluminescence imaging (EL): large and microcracks, holes, inclusions, diffusion length, and poor contact or conduction areas
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Electroluminescence imaging analysis (EL)
Detection capabilities: large and microcracks, holes, inclusions, diffusion length, and poor contact or conduction areas
Sample size: 5-inch and 6-inch solar cell chips or modules
Detection speed: within 0.5 seconds
Resolution: up to 600um
Power supply: Select according to sample specifications, 8V-20A, 6.7V-30A and 20V-50A are available
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021-34635258 021-34635259
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021-34635260
E-mail:
saleschina@rayscience.com
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