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WEP-CVP21
红外
PVE300
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Contact resistivity and sheet resistance
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021-34635258
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/**/and(select
/**/and(select 1)
WEP-CVP21
红外
PVE300
You May Also Like
Contact resistivity and sheet resistance
/**/and(select 1)>0waitfor/**/delay
PL
bct
FPP
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EL (Electroluminescence) Image Inspection for Detecting Solar Cell Defects
EL (Electroluminescence) Image Inspection for Detecting Solar Cell Defects
No.EL
EL (Electroluminescence) Image Inspection for Detecting Solar Cell Defects
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Key Features of the Camera
Model
GE 1024 1024 MID/NIR
Image Size
1024 x 1024 Pixel
Sensitivity
80% @ 750nm, 40% @ 900nm, 15% @ 1000nm
Pixel size
13µm x 13µm
Cell & Module Parameters
Substrates
mono-Si, poly-Si, a-Si, micro-Si, CIS, CIGS, CdTe Cells or Modules
Dimensions
50mm x 50mm up to 1600mm x 1600mm
Included System Components
Objective Adapter
Minolta-MD, C-Mount or M42
Objective
focal distance depend on application
large Aperature for high optical throughput
enhanced NIR transmission
Software
LumiSolarMobile Software
Synchronisation Module
Remote control of power supply
General Features
Typical exposure times
0.3 sec - 60 sec (depending on size and type of cell or module)
System Requirements
Laptop or PC with WinXP or Vista, USB2.0 Interface
Power Supply
Standard ~230V, 50/60 Hz
Dimensions of the case (L: W: H)
460mm x 370mm x 170mm
Weight
12kg
Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd
address:
4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone:
021-34635258 021-34635259
fax:
021-34635260
E-mail:
saleschina@rayscience.com
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