• EL (Electroluminescence) Image Inspection for Detecting Solar Cell Defects
  • EL (Electroluminescence) Image Inspection for Detecting Solar Cell Defects

EL (Electroluminescence) Image Inspection for Detecting Solar Cell Defects

No.EL
EL (Electroluminescence) Image Inspection for Detecting Solar Cell Defects
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  • EL (Electroluminescence) Image Inspection for Detecting Solar Cell Defects
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Key Features of the Camera
Model GE 1024 1024 MID/NIR
Image Size 1024 x 1024 Pixel
Sensitivity 80% @ 750nm, 40% @ 900nm, 15% @ 1000nm
Pixel size 13µm x 13µm

Cell & Module Parameters
Substrates mono-Si, poly-Si, a-Si, micro-Si, CIS, CIGS, CdTe Cells or Modules
Dimensions 50mm x 50mm up to 1600mm x 1600mm

Included System Components
Objective Adapter Minolta-MD, C-Mount or M42
Objective focal distance depend on application
large Aperature for high optical throughput
enhanced NIR transmission
Software LumiSolarMobile Software
Synchronisation Module Remote control of power supply

General Features
Typical exposure times 0.3 sec - 60 sec (depending on size and type of cell or module)
System Requirements Laptop or PC with WinXP or Vista, USB2.0 Interface
Power Supply Standard ~230V, 50/60 Hz
Dimensions of the case (L: W: H) 460mm x 370mm x 170mm
Weight 12kg
Shanghai Sales + Technical Support + After-sales Service Center
Rayscience Optoelectronic Innovation Co., Ltd

address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai
Telephone:
021-34635258 021-34635259
fax:
021-34635260
E-mail:
saleschina@rayscience.com

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