CDE ResMap – CDE's resistance test system CDE ResMap Model 468 is a four-probe process that is used to monitor the quality of semiconductor and photovoltaic manufacturers. This reliable and easy-to-use device is indispensable to semiconductor and photovoltaic manufacturers.
Semiconductor industry industry standard, serving many well-known semiconductor industry users!
Designed to meet the needs of 200 mm high volume manufacturing with SMIF cassettes, the ResMap Model 468-SMIF features CDE's patented multiple probe changer - available in either the two or four probe configuration. This unique capability delivers the most cost effective four point probe for conductive film measurements. This model is capable of handling 200 mm wafers in both SMIF and open cassettes; a 150 mm wafer open cassette adapter is available
Shanghai Sales + Technical Support + After-sales Service Center Rayscience Optoelectronic Innovation Co., Ltd address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai Telephone: 021-34635258 021-34635259 fax: 021-34635260 E-mail: saleschina@rayscience.com
