CDE ResMap – CDE's resistance test system CDE ResMap Model 463-FOUP and 463-OC is a four-probe process that is used to monitor the quality of semiconductor and photovoltaic manufacturers. This reliable and easy-to-use equipment is indispensable for semiconductor and photovoltaic manufacturers.
Semiconductor industry industry standard, serving many well-known semiconductor industry users!
Designed to meet the needs of 300 mm high volume manufacturing, the ResMap Model 463-FOUP is an upgrade of the Model 363 and features CDE's patented multiple probe changer - available in either the two or four probe configuration. This unique capability delivers the most effective cost four point probe for conductive film measurements. This model also has an adapter for 200 mm wafer and 300 mm wafer open cassette loading.
Entrepix - CDE 463-OC
Designed to meet the needs of 300 mm high volume manufacturing, the ResMap Model 463-OC is an upgrade of the Model 363 and features CDE's patented multiple probe changer - available in either the two or four probe configuration. This unique capability delivers the most cost effective four point probe for conductive film measurements. This model is capable of handling 300 mm, 200 mm and 150 mm wafers in open cassettes.
Shanghai Sales + Technical Support + After-sales Service Center Rayscience Optoelectronic Innovation Co., Ltd address: 4th Floor, Building 122, Lane 2338, No. 1 Duhui Road, Minhang District, Shanghai Telephone: 021-34635258 021-34635259 fax: 021-34635260 E-mail: saleschina@rayscience.com
