ResMap Four-Probe Tester
ResMap Four-probe Resistivity Tester
ResMap CDE273 Four-probe Solar Wafer Resistivity Tester
ResMap CDE273 Four-probe Resistivity Tester Introduction:
Four-probe solar wafer resistivity tester
American ResMap four-point probe for photovoltaic testing
ResMap CDE273 four-probe resistivity measurement The features of the tester are briefly described as follows:
* High-speed, stable and patented automatic range determination measurement and transmission, THROUGHPUT high
* Digital method and up to 4000 data collection per point, showing good repeatability and reproducibility
* Windows operating interface and software operation are simple
* New process has good performance (copper process low resistivity 1.67mΩ-cm and Implant high resistivity above 2KΩ/□, both can achieve high accuracy and repeatability)
* Small size, occupies less clean room area
* Simple calibration and long calibration cycle
* Can meet customer needs, enhance functionality and applicability
* 300mm model can be equipped with 2~4 measuring heads, and can be replaced by recipe setting
CDE ResMap – The resistance value test system produced by CDE is based on the four-probe process to cooperate with the production quality control of various semiconductor and photovoltaic manufacturers. The extremely reliable and easy-to-use equipment is indispensable to semiconductor and photovoltaic manufacturers.
ResMap CDE273 Four-probe Resistivity Tester Main Features:
Wide measuring range, high precision, good stability, complete and powerful functions, easy-to-use software, low maintenance cost, good service, complete accessories...
Four point probe (4PP) resistivity tester/block resistance tester/solar photovoltaic diffusion sheet resistance tester imported from the United States
Equipment Name: Four-point Probe Resistance Meter (CDE ResMap)
Host brand, model and accessories: CDE ResMap
Specification:
1. Pin material: Tungsten Carbide.
2. Pin compression force typically 100 gm to 200 gm.
3. Sample size: 2-inch to 6-inch wafer (the surface must be a flat conductive film, semiconductor material)
Equipment application: Resistance distribution measurement of conductive films, semiconductors, photovoltaics
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Features:
1) Consistent needle tip pressure
2) Applicable to various substrate materials
3) Friendly user interface
4) Quick measurement
5) Data can be stored
application:
1) Sheet resistance
2) Sheet resistor
3) Doping concentration
4) Metal layer thickness
5) P/N type
6) I/V test
ResMap CDE273 four-probe resistivity tester test performance indicators:
CDE ResMap – The resistance value test system produced by CDE is a four-probe process to cooperate with the production quality control of various semiconductor and photovoltaic manufacturers. The equipment is both excellent and reliable and easy to operate, which is indispensable for semiconductor and photovoltaic manufacturers.
Semiconductor industry testing standards, serving many well-known semiconductor industry users!
CDE ResMap Model 273
