JXNR-1 Non-contact resistivity Tester
1. Product Features
1 ． Contactless measurement of resistivity of silicon semiconductor materials
2. Suitable for testing silicon wafers without damaging the sample surface.
3. Use general PC to process data, convenient for data storage and printing
4. The software interface is intuitive and friendly
5. Sample calibration is fast and convenient
2. Recommended working conditions
1. temperature: 2 3 ±2℃
2. humidity: 60%~70%
3. No strong light, no strong magnetic field, no proximity to high-frequency equipment
3. Parameters
1 ． Overall size: 340mm × 260mm × 150mm
2 ．Resistivity range: 0.1~50 Ω ﹡ cm
3 ．Error range: ± 5%
4 ． Silicon wafer thickness: suitable for 150-600um thickness
