The light emitted by the AS-Solar5000 light source is diffusely reflected on the surface of the object through the optical fiber and the reflective integrating sphere (InterSphere), and is collected by a specially designed integrator, and then sent to the spectrophotometer through another interface of the integrating sphere. Regardless of whether the sample surface is velvet or polished, all reflected and scattered light will be measured. The overall reflectivity is used to measure the reflectivity of silicon wafers after velvet and coating. Calculate the color value xyy, etc. you want through standard logical operations
AS-Solar5000 The light emitted by the light source passes through the optical fiber and the reflective integrating sphere (InterSphere) on the object. The surface has diffuse reflection The light is collected by a specially designed integrator and sent to the spectrophotometer through another interface of the integrating sphere. Regardless of whether the sample surface is velvet or polished, all reflected and scattered light will be measured. The overall reflectivity is used to measure the reflectivity of silicon wafers after velvet and coating. The color value xyy, etc. you want is calculated through standard logical operations.
AS-Solar5000 The use of integrating sphere can avoid the saturation of spectrometer. Its inner surface is perfect diffuse reflection, with very uniform spatial reflection characteristics. The measurement accuracy can reach 0.1%.
Measurement steps: first collect the intensity of the external ambient light, then place the standard film at the sampling port of the integrating sphere for measurement and save as a reference, and finally place the sample to be measured at the sampling port for measurement. The software will automatically calculate the reflectance R%.
Spectrometer : ASspec-UV/VIS High UV sensitivity spectrometer (200-1100nm)
AS-Solar5000 It is a convenient and practical instrument for testing the reflectivity of velvet polished silicon wafers. The system is easy to use and does not require professional skills. Users can perform continuous measurements on moving silicon wafers or measure fixed points on silicon wafers. Test reports and data storage can be automatically generated. Users can customize the maximum and minimum reflectivity threshold settings. The measurement wavelength range can be customized, and the instrument is equipped with a standard reference film.
