This compact instrument is automated in all axes and can create 100-point sheet resistance and wafer resistivity maps in less than 4 minutes. Single points can be remeasured after clicking on the map and navigating the probe to the desired location.
This compact instrument is motorized in all axes and can produce 100-point sheet resistance and wafer resistivity maps in less than 4 minutes. Single points can be remeasured after the probe is navigated to the desired location by clicking on the map.
The four-point probe can also be used in combination with other measurement methods in TLM-SCAN+.
This compact instrument is automated in all axes and can create 100-point sheet resistance and wafer resistivity maps in less than 4 minutes. Single points can be remeasured after clicking on the map and navigating the probe to the desired location.
design: •Can be combined with other measurements Same instrument (see TLM-SCAN++) •Easy-to-clean glass vacuum cup • Automatically starts measuring when the lid is closed Probe: • Change in seconds • Software approved •Tungsten carbide needle • Tip radius: 0.25 mm software: • Selectable color schemes and data labels for display of maps And has functions such as zoom, histogram, line scan, etc. • Click on the image to remeasure a single point • Current sweep test linearity • Automatic numbering Specification: • Duration of 10 x 10 map: 4 minutes. •Max. test current: 30 mA •Weight: 16 kg •L×W×H (cm): 36×48×24 FPP-SCAN Economical Four-Point Probe Mapper For daily production control
DESIGN: • Can be combined with other measurements in the same instrument (see TLM-SCAN++) • Easy-to-clean glass vacuum chuck • Measurement starts automatically when closing lid PROBE HEADS: • Changed within seconds • Recognized by software • Tungsten carbide needles • Tip radius: 0.25 mm SOFTWARE: • Mappings displayed with selectable color scheme and data labeling and functions like zoom, histogram, line-scans • Re-measure single points by clicking on images • Current-voltage-sweeps to test linearity • Auto numbering SPECIFICATIONS: • Duration for 10 x 10 map: 4 min. • Max. test current: 30 mA • Weight: 16 kg • L feld
